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JSSC 2024第1期Data Converters110nm

A 358 nJNode Dual Cross Correlation Analog-Front-End Circuit With ADC for Mutual

提出一种用于互容面板的双互相关模拟前端电路,降低功耗和面积,提高ADC精度。
110nm CMOS, 12-bit SAR-VCO ADC, 3.58 nJ/node, 0.988 mm², 46.1/50.2 dB SNR
双互相关模拟前端互容面板稀疏采集算法SAR-VCO ADC校准算法
双互相关模拟前端电路解决大负载面板相位差问题
稀疏采集算法减少ADC采集和MCU操作
校准算法提高ADC精度
Abstract
This article presents a dual cross correlation analog- front-end (DCC-AFE) circuit for a mutual capacitive panel. The DCC-AFE circuit solves the problem of reduced recognition abil- ity owing to the phase difference variation between the transmit- ted and received signals for a large load panel. A sparse collection algorithm is adopted to reduce the number of analog-to-digital converter (ADC) collections and microcontroller unit (MCU) operations in the proposed touch system. Only a 12-bit succes