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A 0.39-mm 2 Stacked Standard-CMOS Humidity Sensor Using a Charge-Redistribution Correlated Level Shifting Floating Inverter Amplifier and a VCO-Based Zoom CDC Heyi Li , Student Member , IEEE, Kaixuan Du , Student Member , IEEE
本文提出了一种基于电荷重分配的高效CMOS湿度传感器,具有低误差和高性能。
55nm CMOS, 9.57 µW, ±0.8%RH误差, 197 aF电容分辨率, 0.094%RH湿度分辨率
CMOS湿度传感器电荷重分配相关电平移位堆叠设计标准CMOS工艺
▸创新点1:电荷重分配相关电平移位技术(CR-CLS)通过提升浮动逆变放大器(FIA)的开环增益至少13.5 dB,显著降低了闭环FIA增益误差,从而减少了CDC非线性和湿度误差,实现了±0.8%RH的高精度测量。
▸创新点2:堆叠湿度传感器设计通过在电路上方堆叠一对湿度传感器,不仅降低了成本,还将面积减少了一半,同时保持了标准CMOS工艺的兼容性,实现了高集成度和低成本。
▸创新点3:标准CMOS工艺集成使得整个湿度传感器系统无需额外工艺步骤,直接在55-nm CMOS工艺中实现,显著降低了制造成本和复杂度,同时保持了高性能(197 aF电容分辨率和0.094%RH湿度分辨率)。
▸创新点4:高能效设计通过优化电路结构和转换时间(0.04 ms),在仅消耗9.57 µW的功耗下实现了12.1位的有效位数(ENOB),显著提升了能效比(FoM w: 87 fJ/c.step)。
Abstract
This article reports an energy/area-efficient zoom capacitance-to-digital converter (CDC)-based CMOS humidity sensor. It achieves the best-in-class error of ±0.8%RH and better figure of merit (FoM w; 87 fJ/c.step) than the state-of-the-art humidity sensors due to the use of the two techniques described in the following: 1) a charge-redistribution correlated level- shifting (CR-CLS) floating inverter amplifier (FIA) is proposed to increase the conventional CLS-FIA open-loop gain by at least 13.5 dB across temperature variations (−40 ◦C to 85 ◦C) and the extreme process corners, minimizing the closed-loop FIA gain error and thus the CDC nonlinearity and humidity error and 2) a pair of stacked humidity sensors over the circuits, all of which are included in the standard CMOS process, is proposed to achieve a lower cost and decrease the area by half. The proposed CMOS humidity sensor is implemented in a 55-nm CMOS process. The measurement results show that the capacitance resolution and humidity resolution are 197 aF and 0.094%RH, respectively, at a total input capacitance of 3 pF, and the effective number of bits (ENOB) is 12.1 at a clock frequency of 2.5 MHz and a cycle number per conversion (N) of 16. The proposed humidity sensor consumes 9.57 µW at the conversion time of 0.04 ms. The sensor exhibits a ±0.8%RH peak-to-peak accuracy (3σ error of 2.5%RH) among 40 chips from 20%RH to 85%RH.