← 返回 JSSC 论文列表
📄 下载 JSSC 原文 PDF
JSSC 2024第6期Data Converters28nmDACSRAM

A 28-nm 50.1-TOPS/W P-8T SRAM Compute-In-Memory Macro Design With BL Charge-Sharing-Based In-SRAM DAC/ADC Operations

提出一种基于PMOS的8T SRAM存内计算宏设计,采用BL电荷共享技术降低DAC和ADC硬件成本。
28nm CMOS, 0.6-1.2V, 50.1-TOPS/W, CIFAR-10准确率91.26%
存内计算SRAM电荷共享ADC能效优化
BL电荷共享技术降低DAC面积和功耗
4位粗-细闪存ADC与SRAM内参考电压生成协同设计
电荷域计算实现宽电压范围工作(0.6-1.2V)
Abstract
This article presents a low-cost PMOS-based 8T (P-8T) static random access memory (SRAM) compute-in- memory (CIM) macro that efficiently reduces the hardware cost associated with a digital-to-analog converter (DAC) and an analog-to-digital converter (ADC). By utilizing the bitline (BL) charge-sharing technique, the area and power consumption of the proposed DAC have been reduced while achieving similar conversion linearity compared to a conventional DAC. The BL charge-sharing also facilitates the multiply-accumulate (MAC) operation to produce variation-tolerant and linear outputs. To reduce ADC area and power consumption, a 4-bit coarse- fine flash ADC has been collaboratively used with an in-SRAM reference voltage generation, where the ADC reference voltages are generated in the same way as the MAC operation mechanism. Moreover, to find the suitable ADC sample range and resolution for our CIM macro, a CIM noise-considered accuracy simulation has been conducted. Based on the simulation results, a 4-bit ADC resolution with a cutoff ratio of 0.5 is chosen, maintaining high accuracy. The 256 × 80 P-8T SRAM CIM prototype chip has been fabricated in a 28-nm CMOS process. By leveraging charge- domain computing, the proposed CIM operates in a wide range of supply voltage from 0.6 to 1.2 V with an energy efficiency of 50.1-TOPS/W at 0.6 V . The accuracies of 91.26% and 65.20% are measured for CIFAR-10 and CIFAR-100 datasets, respectively. Compared to the state-of-the-art SRAM CIM wor