A 0.25µm Logarithmic CMOS Imager for EmissivityCompensated Thermography

📋 论文概要

该论文提出了一种0.25µm对数CMOS图像传感器，用于发射率补偿热成像，解决了传统热成像中温度信息强烈依赖被测材料发射率的问题。通过未滤波和滤波响应的比值，实现了发射率补偿，提高了温度测量的准确性。

💡 主要创新点

• 采用对数响应CMOS像素结构，实现宽动态范围温度测量。
• 通过双通道（未滤波和滤波）比值方法，消除材料发射率对温度测量的影响。
• 在0.25µm CMOS工艺中集成，实现低成本、高分辨率的工业热成像应用。

🏷 关键词

📄 原文摘要

Markus Strobel, Joachim N. Burghartz Institute for Microelectronics, Stuttgart, Germany Challenges in the design of solid-state imagers for industrial measurement and control include: high image resolution, wide temperature range, adequate temperature resolution, high measurement speed, thermal stability of the sensor chip, and most importantly, low cost. However, they have the inherent disadvantage that their temperature information is strongly dependent on the emissivity of the probed material. This shortcoming can be eliminated if the ratio of an unfiltered and a filtered response of two photodiodes is considered. The requirement of fast signal ratioing can be well met if a logarithmic CMOS imager [1] is used, since with the lin-log conversion of each diode signal, the signal ratioing is reduced to a signal subtraction. We recently indicated the potential of this concept by using 2 of the color-filtered pixels in a logarithmic

👥 作者与机构

Franz X. Hutter, Daniel Brosch, Heinz-Gerd Graf, Wolfram Klingler,