⚡ 本页包含 AI 生成的分析内容，仅供参考
该论文提出了一种基于SAR ADC的原位温度传感接口，用于补偿晶体振荡器的频率-温度漂移，以满足多无线电移动设备对频率稳定性（<1ppm）的严格要求。该接口在45nm LP数字CMOS工艺中实现，能够应对超过100°C的宽温度范围和快速温度变化。
L.Richard Carley1, Jonathan C. Jensen2 1 Carnegie Mellon University, Pittsburgh, PA Intel, Hillsboro, OR 3 Intel, Haifa, Israel 2 Multi-radio (3G/4G/GPS) mobile communication devices impose stringent requirements (<1ppm) on a crystal oscillator’s (XO) frequency stability over a wide temperature range (>100°C). Furthermore, these devices often subject their internal XOs to sudden temperature ramps caused by power switching during sporadic user activities. In order for applications such as GPS to maintain satellite acquisition under such conditions, a low XO frequency drift rate with temperature (<50ppb/°C) is strongly desired. Traditionally, a discrete analog temperature-compensated XO (TCXO) is often used for crystal frequency temperature compensation. Recently, an integrated digital TCXO (DTCXO) [1] that uses an on-chip PTAT sensor and a ΔΣ ADC interface was presented. However, this system’s accuracy is limited by the proximity-induced temperature difference
Zhenning Wang1, Richard Lin2, Eshel Gordon3, Hasnain Lakdawala2,