An HCI-Healing 60GHz CMOS Transceiver

📋 论文概要

该论文提出了一种具有热载流子注入（HCI）修复功能的60GHz CMOS收发器。通过HCI修复技术，能够恢复发射机输出功率并延长器件寿命，解决了CMOS器件退化导致的可靠性问题。

💡 主要创新点

• 提出HCI修复技术，在60GHz CMOS发射机中动态恢复因热载流子效应导致的功率退化。

📄 原文摘要

Satoshi Kondo, Tomohiro Ueno, Nurul Fajri, Shoutarou Maki, Noriaki Nagashima, Yasuaki Takeuchi, Tatsuya Yamaguchi, Ahmed Musa, Masaya Miyahara, Kenichi Okada, Akira Matsuzawa Tokyo Institute of Technology, Tokyo, Japan The research of 60GHz CMOS transceivers has bloomed due to their capability of achieving low-cost multi-Gb/s short-range wireless communications [1]. Considering practical use of the 60GHz CMOS transceivers, longer operation lifetime with high output power is preferred to provide reliable products. Unfortunately, as indicated in [2], the output power capability of the transmitter will gradually degrade due to the hot-carrier-injection (HCI) effects in the standard CMOS transistors at large-signal operation (e.g. power amplifiers). It is because the inherently large voltage swing at the output of the power amplifiers (PAs) is the main source of the HCI damage. Unfortunately, a thick-oxide

👥 作者与机构

Rui Wu, Seitaro Kawai, Yuuki Seo, Kento Kimura, Shinji Sato,