← 返回论文列表 📄 下载原文 PDF  ISSCC 2024 · 22.5
ISSCC 2024Session 22 · HIGH SPEED ANALOG-TO-DIGITAL CONVERTERSAnalog Circuits16nm

A 42GS/s 7b 16nm Massively Time-Interleaved Slope-ADC

⚡ 本页包含 AI 生成的分析内容,仅供参考

📋 论文概要

本文提出了一种基于斜率ADC的大规模时间交织架构,在16nm工艺下实现了42GS/s、7位分辨率的超高速ADC。通过采用极小的斜率子ADC,解决了传统SAR ADC面积大、互连线长的问题,适用于高速数据转换应用。

💡 主要创新点

核心指标
42 GS/s, 7-bit
工艺节点
16nm
重要性
发表年份
ISSCC 2024

🏷 关键词

时间交织ADC斜率ADC高速ADC16nm CMOS

📄 原文摘要

resolution of 6 to 8 bits and a sampling speed of several tens of GHz are often required [1–5]. To achieve these extremely high speeds, time-interleaved (TI) ADCs with tens of parallel high-speed channels are commonly used. SAR-based sub-ADCs are a popular choice due to their power-efficient architecture. Although SAR ADCs can be small, the need for a DAC and high-speed logic nevertheless results in a significant total area with long interconnection lines. This work introduces an alternative approach for extreme high-speed ADCs based on the paradigm that a slowspeed but extremely small channel allows for a more efficient conversion per area. By arranging them in a 2-dimensional array, interconnections are minimized, and power burned in parasitics is reduced resulting in an energy-efficient and scalable architecture.

👥 作者与机构

Ewout Martens1, Adam Cooman1, Pratap Renukaswamy1, Shun Nagata2,

Sehoon Park1, Jorge Lagos1, Nereo Markulic1, Jan Craninckx1 1 2 imec, Heverlee, Belgium Sony Semiconductor Solutions, Atsugi, Japan For wireline receivers, ADCs with a

分类:Analog Circuits · 年份:ISSCC 2024