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ISSCC 2008Session 12 · HIGH-EFFICIENCY DATA CONVERTERSData Converters90nm CMOS

An 820µW 9b 40MS/s Noise-Tolerant Dynamic-SAR ADC in 90nm Digital CMOS

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📋 论文概要

本文提出了一种在90nm数字CMOS工艺下实现的9位40MS/s噪声容忍动态SAR ADC,功耗仅为820µW。通过采用噪声容忍技术,有效解决了SAR ADC中比较器热噪声限制分辨率的问题,实现了高能效模数转换。

💡 主要创新点

工艺节点
90nm CMOS
重要性
发表年份
ISSCC 2008

🏷 关键词

SAR ADC噪声容忍低功耗动态电路90nm CMOS

📄 原文摘要

battery-powered devices demand the adoption of cheap and power-efficient ADCs. SAR architectures have been recently demonstrated as able to achieve high power efficiency in the moderate-resolution/mediumbandwidth range [1]. However, when the comparator determines in first instance the overall performance, as in most SAR ADCs, comparator thermal noise can limit the maximum achievable resolution. More than 1 and 2 ENOB reductions are observed in [1] and [2], respectively, because of thermal noise, and degradations could be even worse with scaled supply voltages and the extensive use of dynamic regenerative latches without pre-amplification. Unlike mismatch, random noise cannot be compensated by calibration and would finally demand a quadratic increase in power consumption unless alternative circuit techniques are devised.

👥 作者与机构

Vito Giannini1, Pierluigi Nuzzo1, Vincenzo Chironi2,

Andrea Baschirotto2, Geert Van der Plas1, Jan Craninckx1 1 IMEC, Leuven, Belgium, 2University of Salento, Lecce, Italy Current trends in analog/mixed-signal design for

分类:Data Converters · 年份:ISSCC 2008