⚡ 本页包含 AI 生成的分析内容,仅供参考
该论文提出了一种对工艺变化容忍的浮点运算单元,通过电压插值和可变延迟技术来应对工艺变化对关键路径延迟的影响,从而提升处理器在变化条件下的性能和能效。
Process variation will greatly impact the power and performance of future microprocessors. Design approaches based on multiple supply or threshold voltage assignment provide techniques to statically tune critical path delays for energy savings [1]. However, under process variation, the delay of critical paths may vary, and a large number of critical paths in circuits reduces the maximum operating frequency of pipelined processors. One proposed postfabrication solution is to adaptively tune the back-body bias to combat variations for logic structures [2]. Dynamic voltage switching between two power supplies, using level shifters to cross voltage domains, has also been proposed to primarily reduce power [35]. This paper explores two fine-grained, post-fabrication circuittuning techniques to combat process variation for pipelined logic components—voltage interpolation and variable latency. These
Xiaoyao Liang, David Brooks, Gu-Yeon Wei
Harvard University, Cambridge, MA