A CMOS Image Sensor Integrating ColumnParallel Cyclic ADCs with On-Chip Digital Error Correction Circuits

📋 论文概要

该论文提出了一种集成列并行循环ADC和片上数字纠错电路的CMOS图像传感器。旨在解决高速读出时的噪声问题，实现14位以上高分辨率图像输出。

💡 主要创新点

• 采用列并行循环ADC架构，实现高速低噪声模拟读出
• 集成片上数字纠错电路，提高ADC精度和稳定性
• 将高分辨率ADC与像素阵列集成，提升整体图像质量

🏷 关键词

📄 原文摘要

ADCs with high 14b or more of resolution to obtain sufficient image quality after the data pass through the color processing pipeline. A columnparallel ADC in CMOS image sensors helps to enable high-speed readout of high-quality images by preventing the large wideband noise caused by high-speed analog readout circuits to be superimposed. Recently, a 6.4Mpixel low-noise CMOS image sensor with a column-parallel single-slope 12b ADC and a VGAsize wide dynamic-range CMOS image sensor with a columnparallel 12b cyclic ADC have been developed [1][2]. The resolutions of column-parallel ADCs that have been developed to date are limited to 12b. This paper presents a CMOS image sensor integrating a 14b column-parallel cyclic ADC with on-chip

👥 作者与机构

Shoji Kawahito1, Jong-Ho Park2, Keigo Isobe2, Suhaidi Shafie1,

Tetsuya Iida1, Takashi Mizota3 1 Shizuoka University, Hamamatsu, Japan Brookman Lab, Hamamatsu, Japan 3 Sanei Hytechs, Hamamatsu, Japan 2 Digital still and video cameras require