90nm 4.7ps-Resolution 0.7-LSB Single-Shot Precision and 19pJ-per-Shot Local Passive Interpolation Time-to-Digital Converter with OnChip Characterization

📋 论文概要

该论文提出了一种基于局部无源插值的高分辨率时间-数字转换器(TDC)，在90nm CMOS工艺下实现了4.7ps分辨率、0.7-LSB单次精度和19pJ/转换的低功耗。解决了传统Vernier TDC延迟线过长的问题，适用于时间飞行测量、抖动测试等应用。

💡 主要创新点

• 采用局部无源插值技术实现亚门级延迟分辨率，避免了长延迟线带来的面积和功耗开销。
• 通过单次精度0.7-LSB和19pJ/转换的低功耗，实现了高性能与低能耗的平衡。

🏷 关键词

📄 原文摘要

Infineon Technologies, Munich, Germany Technical University Munich, Munich, Germany 2 Time-to-digital converters (TDC) support the industry wide trend of replacing mixed-signal functionality by digital realizations. High-resolution TDCs [1] become increasingly popular for time-offlight measurements, full-speed testing, e.g., jitter measurement, clock and data recovery, measurement and instrumentation, and digital PLLs. As the speed leverage of technology scaling decreases below 100nm, robust TDCs with sub-gate-delay resolution are essential. The Vernier TDC [2] requires long delay lines, thus suffers from large latency, area and power consumption. Latency and a resolution limited by the inherent variation-related pulse-width modification are the drawbacks of the pulse-shrinking approach

👥 作者与机构

Stephan Henzler1, Siegmar Koeppe1, Winfried Kamp1, Hans Mulatz2, Doris Schmitt-Landsiedel2