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该论文提出了一种可拉伸的EMI测量片，集成了8×8线圈阵列、2V有机CMOS解码器和-70dBm EMI检测电路，用于解决电子设备中电磁干扰的可靠性问题。
Koichi Ishida1, Naoki Masunaga1, Zhiwei Zhou1, Tadashi Yasufuku1, Tsuyoshi Sekitani1, Ute Zschieschang2, Hagen Klauk2, Makoto Takamiya1, Takao Someya1, Takayasu Sakurai1 1 University of Tokyo, Tokyo, Japan Max Planck Institute for Solid State Research, Stuttgart, Germany 2 Electromagnetic interference (EMI) is a serious issue degrading the dependability of electronic devices. The issue is complicated by the following technology trends: 1) RF signals and clock pulses of digital ICs are in the same frequency range. 2) The increase of LSI power consumption causes an increase of noise emission. 3) Electronic devices have 3D-structures and packaging is dense. These trends also make the root cause analysis of EMI difficult. For example, it is difficult to find the EMI generation points in electronic devices such as cell-phones and PDAs. Typical frequencies of concern with respect to EMI issues is from 30MHz to
Array, 2V Organic CMOS Decoder, and -70dBm EMI, Detection Circuits in 0.18µm CMOS