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该论文提出了一种12位22.5/45MS/s的SAR ADC,在0.059mm²的小面积和3.0mW的低功耗下实现了超过90dB的SFDR。通过优化开关逻辑和电容阵列,解决了高速高精度SAR ADC中功耗与面积之间的矛盾。
CMOS technology scaling has opened a pathway to high-performance analogto-digital conversion in the nanometer regime, where switching is preferred over amplifying. Successive-approximation-register (SAR) is one of the conversion architectures that rely on the high switching speed of process technology, and is thus distinctively known for its superior energy efficiency, small chip area, and good digital compatibility. When properly implemented, a SAR ADC also benefits from a potential rail-to-rail input swing, 100% capacitance utilization during input sampling (thus low kT/C noise), and insensitivity to comparator offsets during the conversion process. The linearity-limiting factors for SAR ADC are capacitor mismatch, sampling switch non-idealities, as well as the reference voltage settling issue due to the high internal switching speed of the DAC. In this work, a sub-radix-2 SAR ADC is presented, which employs a perturbation-based
Wenbo Liu, Pingli Huang, Yun Chiu
University of Illinois at Urbana-Champaign, Urbana, IL