⚡ 本页包含 AI 生成的分析内容,仅供参考
该论文提出了一种智能固态硬盘(SSD)设计,采用不对称编码和条纹模式消除技术,能够将存储错误率降低95%,同时功耗降低43%。针对NAND闪存随尺寸缩小而出现的干扰和程序扰动问题,通过编码和模式优化提升可靠性。
memory errors by 95% and reduce power consumption by 43%. Figure 11.4.1 shows the measured memory cell error in the data retention and program disturb of 4X, 3X and 2Xnm NAND flash memories. As the memory size decreases, both data retention and program disturb errors increase due to the interference, random telegraph noise and reduced electrons [1]. In the scaled NAND, the electric field in the channel increases [2] and the program disturb due to GIDL-induced hot electron injection becomes more significant (Fig. 11.4.1(c)). In conventional SSDs, 20 to 40b correction per 1KB codeword error-correcting code (ECC) is used to correct errors [3]. As stronger codes, such as LDPC, are developed [4], the capability of ECC is close to the Shannon limit of a few percent error correction. Thus, the additional high-reliability scheme is req
Shuhei Tanakamaru1, Chinglin Hung1, Atsushi Esumi2, Mitsuyoshi Ito2,
Kai Li2, Ken Takeuchi1 1 2 University of Tokyo, Tokyo, Japan, SIGLEAD, Yokohama, Japan This paper presents intelligent solid-state drives (SSDs), which decrease