ISSCC 2026
Session 37
Memory
A 14Gb/s/pin 0.163pJ/b DQ Receiver for HBM with Baud-Rate Phase Tracking Loop Supporting Background Offset Calibration
Abstract This paper presents a compact 14Gb/s/pin HBM DQ receiver that continuously tracks sampling phase and detector offset in live data, using a baud-rate phase tracking loop with a background-calibrated time-window p
ISSCC 2026
Session 37
Memory
A 0.87pJ/b 17Gb/s/pin Parallel Receiver with a Local DQS Recovery for a Supply-Noise-Tolerant DQS Distribution in High-Performance NAND Flash Interfaces
Abstract This work presents a 0.87pJ/b, 17Gb/s/pin parallel receiver with local DQS recovery and a dual-DQS tree for reduced clock power and mitigated power supply-induced jitter (PSIJ). The local DQS recovery time-multi
ISSCC 2026
Session 37
Memory
A 12.8Gb/s Parallel Receiver with a One-Way Self-Training Scheme for Equalizing ISI and Reflections in Multi-Drop Memory Interfaces
8Gb/s/pin receiver with a one-way self-training scheme for highlyreflective multi-drop memory interfaces. DFE tap coefficients are directly derived from a single-pulse response, eliminating controller interaction during
ISSCC 2026
Session 37
Memory
A 0.092pJ/b and 7.7fJ/b/dB Cross-Self-Referenced Slope-Sampling Receiver with Long-Tail ISI Robustness for Next-Generation Low-Power Memory Interfaces
*Equally Credited Authors (ECAs) Abstract We present a cross-self-referenced slope-sampling RX that is robust against long-tail ISI, without equalization, for next-generation low-power memory interfaces. By determining r
ISSCC 2026
Session 37
Memory
A 16Gb/s/pin 0.51pJ/b Single-Ended NRZ Transceiver with Distributed Dual-Loop VDDQ-Ripple Compensation and Dynamic Clock Duty-Cycle Calibration for Memory Interfaces
*Equally Credited Authors (ECAs) 1 Abstract A 16Gb/s/pin 0.51pJ/b single-ended NRZ transceiver with distributed dual-loop compensation (DDLC) for VDDQ-ripple suppression and dynamic duty-cycle calibration (DDCC) for robu
ISSCC 2026
Session 37
Memory
A 2nm All-Digital 14.4Gb/s/pin LPDDR6 PHY with Quarter-Rate Clocking Architecture and Multi-Level FIFO-Based Speculative DFE
LPDDR6 PHY that achieves 14.4Gb/s/pin, increasing bandwidth while optimizing power. Key innovations include quadrature clocking, with QEC, to reduce jitter sensitivity, and a multi-level FIFO-based speculative DFE to rel
ISSCC 2026
Session 37
Memory
A 47.0Tb/s/mm 112Gb/s/pin PAM4 Single-Ended Transceiver Featuring 4-Aggressor Crosstalk Cancellation and Supply-Noise Tolerance for Short-Reach Memory Interfaces
Interdisciplinary Research Center for Future Intelligent Chips (Chip-X), Suzhou, China 1 3 Abstract This paper presents a five-lane 112Gb/s/pin PAM4 single-ended transceiver in 28nm CMOS for high-density short-reach memo
ISSCC 2026
Session 37
Memory
A 72Gb/s/pin Single-Ended Driver-Cooperative Coded PAM3 Transceiver with Asymmetric Data-Dependent Equalization and Bias-Peaking for Chiplets and Memory Interfaces
Abstract This paper presents a 72Gb/s/pin PAM-3 single-ended transceiver in 28nm CMOS. Drivercooperative coding enhances signal integrity and reduces signaling power by ≥46%. Asymmetric data-dependent equalization and bi
ISSCC 2026
Session 15
Memory
A 16Gb 12.8Gb/s LPDDR6 SDRAM with 12-DQ/Sub-Channel Wide NRZ Signaling and Enhanced Reliability by Per-Row Activation Counting and Meta-Data Scheme
JongMoon Choi, Sung-Woo Yoon, Sang Yun Kim, Dongkeon Lee, Minsoo Jang, Daehyun Kwon, Sangyong Lee, Jinguk Kim, Jonghyuk Kim, In Jung, Taeha Song, Chang Won Kim, Seung Ho Baek, Jinyong Choi, Young-Hun Seo, Won Ho Choi, Ch
ISSCC 2026
Session 15
Memory
A 36GB 3.3TB/s HBM4 DRAM with Per-Channel TSV RDQS Auto Calibration and Fully-Programmable MBIST
ChangHyun Bae, Joohwan Kim, Je-Min Ryu, Shin-haeng Kang, Jaehoon Lee, Young-Uk Chang, JaeKyung Lee, JongTae Hwang, Daehwan Seo, Ki-Heon Na, Young Guen Song, Daihyun Lim, Kyung-Soo Ha, Young-Soo Sohn, Sang-Joon Hwang Sams
ISSCC 2026
Session 15
Memory
A 3nm 0.167fJ/b 5.27Mb/mm2 Configurable TCAM with Macro-Wise Pipelined Search Methods for Automotive Applications
Abstract This paper presents a TCAM design that includes a bank-less small-grain TCAM-macro compiler, a configurable soft-macro generator, selective macro-wise pipelined search techniques, and a split data-bus architectu
ISSCC 2026
Session 15
Memory
A 16nm 168Mb Embedded STT-MRAM with 0.0249µm2 Bit-Cell, Dual-Port Access, and 51.2Gb/s Read Throughput for Automotive and Edge AI Applications
Chao-Jung Hung1, Tan-Li Chou1, Chih-Hui Weng2, Chia-Yu Wang2, J.J. Wu2, Harry Chuang2, Yih Wang1, Yu-Der Chih1, Tsung-Yung Jonathan Chang1 TSMC Design Technology, Hsinchu, Taiwan, 2TSMC, Hsinchu, Taiwan 1 Abstract A 16nm
ISSCC 2026
Session 15
Memory
An 8nm eMRAM for Auto-G1 with a 125MHz Read Speed at 0.6V and 19.94Mb/mm2 Density
Seungpil Ko2, Jaechul Shim2, Shinhee Han1, Kiseok Suh1, Sohee Hwang1, Hyunchang Lee1, Jonghoon Jung1, Sanghoon Baek1 Samsung Semiconductor, Gyunggido Kiheung, Korea, 2Samsung Semiconductor, Gyunggido Hwasung, Korea 1 Abs
ISSCC 2026
Session 15
Memory
A 350mV Single-Rail SRAM Using a Custom-Logic-Bitcell in 2nm-CMOS-Nanosheet Technology for Mobile and Edge-AI Applications
Abstract This work presents a single-rail, 21.04Mb/mm2 logic-bitcell 2-port SRAM in a 2nm nanosheet technology for CPU, GPU and NPU caches. The implemented xBIT cell in a 2R×1C configuration uses dual BL for balanced NMO
ISSCC 2026
Session 15
Memory
A Vertical-Cell-Transistor-Based 4F2 DRAM with Cell-on-Peripheral Architecture Using Wafer-to-Wafer Hybrid Copper Bonding
Sang-Hoon Jung, Seunghan Woo, Donggeon Kim, Jonghyuk Kim, In Jung, Junsoo Kim, Jae-Joon Song, InCheol Nam, Young-Hun Seo, Sungsoo Yim, Jemin Park, Changsik Yoo, SangJoon Hwang Samsung Electronics, Hwaseong, Korea Abstrac
ISSCC 2026
Session 15
Memory
A 2Tb 4b/Cell 6-Plane 3D-Flash Memory with 37.6Gb/mm2 Bit Density and >85MB/s Write Throughput
Kazuki Yamauchi2, Indra K V1, Masahiro Kano2, Sirisha Bhamidipati1, Sneha Bhatia1, Seema Malhotra1, Naoki Ojima2, Ella Wu3, Zhiyong Yang3, Frank W. Tsai3, Mathias Bayle2, Naoyuki Minami2, Yasuyuki Fujihara2, Kei Kitamura
ISSCC 2025
Session 30
Memory
A 64Gb DDR4 STT-MRAM Using a Time-Controlled Discharge-Reading Scheme for a 0.001681μm2 1T-1MTJ Cross-Point Cell
Takaya Yasuda1, Akira Katayama1, Tadashi Miyakawa1, Kazuyo Senju1, Kazuki Okawa1, Yuka Furukawa1, Yu Shimada1, Katsuya Kotake1, Sayaka Hirokawa1, Min Chul Shin2, Dong Keun Kim2, Tae Ho Kim2, Kyunghoon Kim2, Hisanori Aika
ISSCC 2025
Session 30
Memory
A 321-Layer 2Tb 4b/cell 3D-NAND-Flash Memory with a 75MB/s Program Throughput
Jayoon Goo1, Sangkyu Lee1, Kayoung Cho1, Tei Cho1, Dauni Kim1, Gwan Park1, Yushin Ahn1, Sooyeol Chai1, Gwihan Ko1, Sunyoung Jung1, Eunwoo Jo1, Taehun Park1, Jinhyun Ban1, Cheoljoong Park1, Jae Hyun Park1, Sanghoon Oh1, S
ISSCC 2025
Session 30
Memory
A 16Gb 12.7Gb/s/pin LPDDR5-Ultra-Pro DRAM with 4-Phase Self-Calibration and AC-Coupled Transceiver Equalization in a 5th-Generation 10nm DRAM Process
Jin-Kwan Park, Hyun-Kyu Oh, Bo-Hyeon Lee, Dong-Wan Ko, Tae-Seob Oh, Seung-Gi Hong, Chang-Ki Kwon, Daihyun Lim, Myeong-O Kim, Seung-Jun Bae, Tae-Young Oh, Sang-Jun Hwang Samsung Electronics, Hwaseong, Korea The rapid grow
ISSCC 2025
Session 30
Memory
A 24Gb 42.5Gb/s GDDR7 DRAM with Low-Power WCK
Sang-Hoon Kim, Jaehyeok Baek, Moon-Chul Choi, Daewoong Lee, Donggun An, Se mi Kim, Yeonggeun Song, Minkyo Shim, Sung-Yong Cho, Dongha Lee, Gunhee Cho, In-Woo Jun, Juseop Park, TaeYoon Lee, Hwan-Chul Jung, Chanyong Lee, G
ISSCC 2025
Session 30
Memory
A 1Tb 3b/cell 3D-Flash Memory with a 29%-Improved-EnergyEfficiency Read Operation and 4.8Gb/s Power-Isolated Low-Tapped-Termination I/Os
Yumi Higashi1, Yutaka Shimizu1, Akihiro Imamoto1, Kazuaki Kawaguchi1, Koji Tabata1, Takeshi Nakano1, Yusuke Ochi1, Hiroaki Hoshino1, Takeshi Hioka1, Shigehito Saigusa1, Hiroki Date1, Masaki Unno1, Jumpei Sato1, You Kamat
ISSCC 2025
Session 30
Memory
A 28Gb/mm2 4XX-Layer 1Tb 3b/cell WF-Bonding 3D-NAND Flash with 5.6Gb/s/pin IOs
Chung-Ho Yu, Hirano Makoto, Yongseok Kwon, Jong-Hoon Park, Ho-Joon Kim, Daein Lee, Donghyun Seo, Byungrok Go, Seoyoon Jeon, Yoonjee Kim, Doo-Hyun Kim, Youngmin Jo, Hyunjun Yoon, Junehong Park, Inmo Kim, Sunghoon Kim, Hok
ISSCC 2025
Session 29
Memory
A 3nm 3.6GHz Dual-Port SRAM with Backend-RC Optimization and a Far-End Write-Assist Scheme
Cheng-Han Lin1, Shan-Ru Liao1, Kenta Torigoe2, Shirleen Xia3, Yuichiro Ishii3, Yao-Yi Liu1, Jhon-Jhy Liaw1, Yen-Huei Chen1, Hung-Jen Liao1, Tsung-Yung Jonathan Chang1 TSMC, Hsinchu, Taiwan TSMC Design Technology Japan, O
ISSCC 2025
Session 29
Memory
A 38Mb/mm2 380/540mV Dual-Rail SRAM in 3nm-FinFET Technology its leakage is eliminated and INCM returns to VDDA to stop P1 leakage. When opaque LCLKT is at VDDA and the cross-coupled NMOS/PMOS latch is enabled; input switching does not propagate to the output until the latch is transparent.
Prasanna Nalawar4, Yogeshbhai Patel2, Shailendra Sharad2, Shakti Singh2 A clock buffer with high-voltage LS bypass is shown in Fig. 29.4.3, its design supports an extended voltage range when a large forward split is appl
ISSCC 2025
Session 29
Memory
A 3nm FinFET 2.2Gsearch/s 0.305fJ/b TCAM with Dynamically Gated Search Lines for Data-Center ASICs
classification and forwarding are fundamental tasks for data-center network (DCN) components, such as switches and routers, which are used to efficiently manage and direct network traffic. Packet classification involves
ISSCC 2025
Session 29
Memory
A 0.021μm2 High-Density SRAM in Intel-18A-RibbonFET Technology with PowerVia-Backside Power Delivery
Kaushal Dave1, Arash Joushaghani1, Narae Kang1, Minwoo Ko1, Anandkumar Mahadevan Pillai2, Hema Chandra Prakash Movva1, Gyusung Park1, Muktadir Rahman1, Seenivasan Subramaniam1, Vinay Vashishtha1, Teng Yang1, Zheng Guo1,
ISSCC 2025
Session 29
Memory
A 38.1Mb/mm2 SRAM in a 2nm-CMOS-Nanosheet Technology for High-Density and Energy-Efficient Compute
Teja Masina, Kuo-Cheng Lin, Po-Sheng Wang, Yangsyu Lin, Chih-Yu Lin, Yi-Hsin Nien, Hidehiro Fujiwara, Ku-Feng Lin, Ming-Hung Chang, Ching Wei Wu, Robin Lee, Yih Wang, Hung-Jen Liao, Quincy Li, Ping Wei Wang, Geoffrey Yea
ISSCC 2025
Session 22
Memory
A 0.3pJ/b 32Gb/s/pin Single-Ended PAM-4 Receiver with a Delay-Less Capacitive-Feedback Equalizer
multi-level signaling techniques such as PAM3 and PAM4 are being increasingly adopted [1-7]. However, the lower SNR due to multi-level signaling necessitates complex equalization, increasing power consumption and area. T
ISSCC 2025
Session 22
Memory
A 32-to-50Gb/s/pin Single-Ended PAM-4 Transmitter with a ZQ-Based FFE and PAM-4 LSB DBI-DC Encoding
demand for data processing and transmission has surged: highlighting the need for high-speed and energy-efficient data transmission between processors and memory. While data processing capabilities continue to advance, t
ISSCC 2025
Session 22
Memory
A 42Gb/s Single-Ended Hybrid-DFE PAM-3 Receiver for GDDR7 Memory Interfaces
Changhyun Pyo1, Seulgi Kim1, Byungjun Kang1, Eunji Song1, Kwangjin Na1, Jinyoup Cha1, Hyesoo Kim1, Shinyoung Park1, Woo-Seok Choi2, Kyunghoon Kim1, Hae-Kang Jung1, Joohwan Cho1, Jonghwan Kim1 SK hynix, Icheon, Korea Seou
ISSCC 2025
Session 22
Memory
An 850μW 2-to-5GHz Jitter-Filtering and Instant-Toggling Injection-Locked Quadrature-Clock Generator for Low-Power Clock Distribution in HBM Interfaces
KAIST, Daejeon, Korea 1 2 *Equally Credited Authors (ECAs) The explosive expansion of generative AI, in various industries, has led to a surge in demand for high-bandwidth memory (HBM) devices that feature thousands of D
ISSCC 2025
Session 22
Memory
A 0.275pJ/b 42Gb/s/pin Clock-Referenced PAM3 Transceiver
multi-chip modules (MCMs), die-to-die (D2D), and chiplet interfaces (e.g. UCIe) requires high-bandwidth densities while minimizing power consumption [1,3,4,11-13]. Single-ended (SE) PAM3 signaling has been adopted in GDD
ISSCC 2022
Session 7
Memory
A 512Gb In-Memory-Computing 3D-NAND Flash Supporting Similar-Vector-Matching Operations on Edge-AI Devices
Bo-Rong Lin1, Huai-Mu Wang1, Yen-Po Lin1, Yu-Chao Lin1, Chih-Chang Hsieh1, Chia-Ming Hu1, Yi-Ting Lai1, Han-Sung Chen1, Yuan-Hao Chang4, Hsiang-Pang Li1, Tei-Wei Kuo3,5, Keh-Chung Wang1, Meng-Fan Chang2, Chun-Hsiung Hung
ISSCC 2022
Session 7
Memory
A 1Tb 3b/Cell 8th-Generation 3D-NAND Flash Memory with 164MB/s Write Throughput and a 2.4Gb/s Interface
Yeong Seon Kim, Daehoon Na, Sara Choi, Youngsun Song, Jonghoon Lee, Hyunjun Yoon, Kangbin Lee, Byunghoon Jeong, Sanglok Kim, Junhong Park, Cheon An Lee, Jaeyun Lee, Jisang Lee, Jin Young Chun, Joonsuc Jang, Younghwi Yang
ISSCC 2022
Session 7
Memory
A 1-Tb Density 4b/Cell 3D-NAND Flash on 176-Tier Technology with 4-Independent Planes for Read using CMOS-Under-the-Array
Jonathan Pabustan1, Joe Xu1, Srinivas Deshmukh1, Kim-Fung Chan1, Michael Piccardi1, Kevin Xu1, Guan Wang1, Kaveh Shakeri1, Vipul Patel1, Tomoko Iwasaki1, Tongji Wang1, Padma Musunuri1, Carl Gu1, Ali Mohammadzadeh1, Ali G
ISSCC 2022
Session 7
Memory
A 1-Tb 4b/Cell 4-Plane 162-Layer 3D Flash Memory with a 2.4-Gb/s I/O Speed Interface
Pradeep Anantula1, Stanley Jeong1, Anirudh Amarnath1, Siddhesh Darne1, Sneha Bhatia2, Tianyu Tang1, Aditya Arya1, Naman Rastogi1, Naoki Ookuma1, Hiroyuki Mizukoshi1, Alex Yap1, Demin Wang1, Steve Kim1, Yonggang Wu1, Min
ISSCC 2022
Session 28
Memory
A Supply-Noise-Induced Jitter-Cancelling Clock Distribution Network for LPDDR5 Mobile DRAM featuring a 2nd-order Adaptive Filter
SK hynix, Icheon, Korea 3 Korea Aerospace Research Institute, Daejeon, Korea 4 KAIST, Daejeon, Korea 1 2 *Equally Credited Authors (ECAs) With the increasing demand for low-power, high-speed DRAMs, LPDDR5 featuring a spe
ISSCC 2022
Session 28
Memory
A 20-Gb/s/pin 0.0024-mm2 Single-Ended DECS TRX with CDR-less Self-Slicing/Auto-Deserialization to Improve Tolerance on Duty Cycle Error and RX Supply Noise for DCC/CDR-less Short-Reach Memory Interfaces
Samsung Electronics, Hwaseong, Korea SSC DECS input, the resulting clock and data paths are equally matched and the impact of the RX SN on the RX performance is minimized. In a conventional RX the sampling clock is gener
ISSCC 2022
Session 28
Memory
A 78.8fJ/b/mm 12.0Gb/s/Wire Capacitively Driven On-Chip Link Over 5.6mm with an FFE-Combined Ground-Forcing Biasing Technique for DRAM Global Bus Line in 65nm CMOS
Advances in virtual reality, artificial intelligence, and big data have increased demand for high-bandwidth memory. Accordingly, pre-fetch sizes have also increased with DRAM generations, meaning an increased number of g
ISSCC 2022
Session 28
Memory
A 0.385-pJ/bit 10-Gb/s TIA-Terminated Di-Code Transceiver
Hyunsu Park1, Yoonjae Choi1, Jincheol Sim1, Jonghyuck Choi1, Youngwook Kwon1, Junyoung Song2, Chulwoo Kim1 Korea University, Seoul, Korea Incheon National University, Incheon, Korea 1 2 The bandwidth of parallel DRAM I/O
ISSCC 2022
Session 28
Memory
A 20 Gb/s/pin 1.18pJ/b 1149µm2 Single-Ended Inverter-based 4-tap Addition-Only Feed-Forward Equalization Transmitter with Improved Robustness to Coefficient Errors in 28nm CMOS
matching method [3], the signal integrity problems are resolved by matching the farend terminal to 50Ω. This technique can improve the voltage swing of the inverters. The half-rate digital inputs are serialized by the re
ISSCC 2022
Session 28
Memory
A 16Gb 9.5Gb/s/pin LPDDR5X SDRAM with Low-Power Schemes Exploiting Dynamic Voltage-Frequency Scaling and Offset-Calibrated Readout Sense Amplifiers in a Fourth Generation 10nm DRAM Process
Seokjin Cho, Kihan Kim, Seung-Hoon Oh, Hye-Yoon Joo, Geuntae Park, Jin-Hun Jang, Yong-Hun Kim, Donghun Lee, Jaehoon Jung, Yongmin Kwon, Youngjae Kim, Jaewoo Jung, Seongil O, Seoulmin Lee, Jaeseong Lim, Junho Son, Jisu Mi
ISSCC 2022
Session 28
Memory
A 16Gb 27Gb/s/pin T-coil based GDDR6 DRAM with
frequency. When LF_ON is low (LF_ONB is high), the CML resistance and its current changes in the opposite direction and the center frequency is close to 12GHz (24Gb/s). As a result, the proposed frequency divider covers
ISSCC 2022
Session 28
Memory
A 192-Gb 12-High 896-GB/s HBM3 DRAM with a TSV AutoCalibration Scheme and Machine-Learning-Based Layout Optimization
Sangsic Yoon, Dong Uk Lee, Seokwoo Choi, Jihwan Park, Jinhyung Lee, Kyungjun Cho, Junil Moon, Byung-Kuk Yoon, Young-Jun Park, Sang-muk Oh, Chang Kwon Lee, Tae-Kyun Kim, Seong-Hee Lee, Hyun-Woo Kim, Yucheon Ju, Seung-Kyun
ISSCC 2021
Session 30
Memory
A 1Tb 3b/Cell 3D-Flash Memory in a 170+ Word-Line-Layer Technology
Mitsuhiro Abe1, Teruo Takagiwa1, Yuki Shimizu1, Junji Musha1, Katsuaki Sakurai1, Jumpei Sato1, Tetsuaki Utsumi1, Kazuhide Yoneya1, Yasuhiro Suematsu1, Toshifumi Hashimoto1, Takeshi Hioka1, Kosuke Yanagidaira1, Masatsugu
ISSCC 2021
Session 30
Memory
A 512Gb 3b/Cell 7th-Generation 3D-NAND Flash Memory with 184MB/s Write Throughput and 2.0Gb/s Interface
Bong-Kil Jung, Jaedoeg Lyu, Hogil Lee, Won-Tae Kim, Hongsoo Jeon, Sunghoon Kim, In-Mo Kim, Jae-Ick Son, Kyoungtae Kang, Sang-Won Shim, JongChul Park, Eungsuk Lee, Kyung-Min Kang, Sang-Won Park, Jaeyun Lee, Seung Hyun Moo
ISSCC 2021
Session 30
Memory
A 1Tb 4b/Cell 144-Tier Floating-Gate 3D-NAND Flash Memory with 40MB/s Program Throughput and 13.8Gb/mm2 Bit Density
Kristopher H. Gaewsky2, Chang Wan Ha1, Rezaul Haque2, Owen W. Jungroth2, Steven Law1, Aliasgar S. Madraswala2, Binh Ngo2, Naveen Prabhu V2, Shantanu Rajwade1, Karthikeyan Ramamurthi2, Rohit S. Shenoy1, Jacqueline Snyder2
ISSCC 2021
Session 30
Memory
A 176-Stacked 512Gb 3b/Cell 3D-NAND Flash with 10.8Gb/mm2 Density with a Peripheral Circuit Under Cell Array Architecture
Hyunsoo Lee, Sungmook Lim, Sun-Young Jung, Hyeongjin Choi, Taikyu Kang, Gwan Park, Chul-Woo Yang, Jeong-Gil Choi, Gwihan Ko, Jaehyeon Shin, Ingon Yang, Junghoon Nam, Hyeokchan Sohn, Seok-In Hong, Yohan Jeong, Sung-Wook C
ISSCC 2021
Session 25
Memory
An 8Gb GDDR6X DRAM Achieving 22Gb/s/pin with Single-Ended PAM4 Signaling
Wolfgang Spirkl2, Martin Bach2, Mani Balakrishnan2, Stefan Dietrich2, Fabien Funfrock2, Milena Ivanov2, Natalija Jovanovic2, Maksim Kuzmenka2, Daniel Lauber2, Juan Ocon-Garrido2, David Ovard1, Karl Pfefferl2, Sven Piatko
ISSCC 2021
Session 25
Memory
A 16Gb Sub-1V 7.14Gb/s/pin LPDDR5 SDRAM Applying a
Body Biasing in a 3rd-Generation 10nm DRAM Yong-Hun Kim, Hyung-Jin Kim, Jaemin Choi, Min-Su Ahn, Dongkeon Lee, Seung-Hyun Cho, Dong-Yeon Park, Young-Jae Park, Min-Soo Jang, Yong-Jun Kim, Jinyong Choi, Sung-Woo Yoon, Jae-
第 1/6 页 · 共 266 篇 · 下一页 →