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ISSCC 2026Session 37 · MEMORY INTERFACEMemory65nm CMOS

A 0.092pJ/b and 7.7fJ/b/dB Cross-Self-Referenced Slope-Sampling Receiver with Long-Tail ISI Robustness for Next-Generation Low-Power Memory Interfaces

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📋 论文概要

本文提出了一种交叉自参考斜率采样接收机,通过基于输入信号斜率判定数据,增强了对长尾码间干扰的鲁棒性,无需均衡器。该接收机在65nm CMOS工艺下实现,在12.5Gb/s速率下能效为0.092pJ/b,FoM为7.7fJ/b/dB,面积仅0.001mm²,适用于下一代低功耗存储器接口。

💡 主要创新点

核心指标
0.092pJ/b @ 12.5Gb/s, 7.7fJ/b/dB @ 12Gb/s
工艺节点
65nm CMOS
重要性
发表年份
ISSCC 2026

🏷 关键词

交叉自参考斜率采样长尾码间干扰低功耗存储器接口接收机

📄 原文摘要

*Equally Credited Authors (ECAs) Abstract We present a cross-self-referenced slope-sampling RX that is robust against long-tail ISI, without equalization, for next-generation low-power memory interfaces. By determining received data based on the slope of the input signal, the proposed architecture enhances resilience to accumulated post-cursor ISI. Fabricated in a 65-nm CMOS process, the prototype achieves a 0.092pJ/b energy efficiency at 12.5Gb/s and a 7.7fJ/b/dB FoM at 12Gb/s, while occupying only 0.001mm2. As power-hungry data-centric applications are widely employed, the need for energyefficient high-bandwidth communication between processing units and off-chip memory is increasing. Consequently, low-power double-data-rate (LPDDR) dynamic random-access memory (DRAM) is being adopted in data centers and edge devices due to its energy efficiency. As data rates continue to rise, across LPDDR generations, channel loss becomes

👥 作者与机构

Ki-Soo Lee*, Chanheum Han*, Joo-Hyung Chae

Kwangwoon University, Seoul, Korea

分类:Memory · 年份:ISSCC 2026