An 80µVrms-Temporal-Noise 82dB-Dynamic-Range CMOS Image Sensor with a 13-to-19b VariableResolution Column-Parallel FoldingIntegration/Cyclic ADC

📋 论文概要

该论文提出了一种具有80µVrms时域噪声和82dB动态范围的CMOS图像传感器，采用13至19位可变分辨率的列并行折叠ADC，解决了低光照成像中时域噪声与动态范围之间的折衷问题。通过列并行放大器和可变分辨率ADC，实现了高增益下的低噪声与宽动态范围。

💡 主要创新点

• 提出了一种13至19位可变分辨率的列并行折叠ADC，可根据光照条件动态调整分辨率，兼顾了低光照下的高灵敏度和高光照下的宽动态范围。
• 实现了80µVrms的超低时域噪声和82dB的高动态范围，通过列并行放大器优化噪声性能，同时保持高动态范围。

🏷 关键词

📄 原文摘要

Taishi Takasawa1, Tomoyuki Akahori2, Keigo Isobe2, Takashi Watanabe2, Shinya Itoh1, Shoji Kawahito1,2 1 Shizuoka University, Hamamatsu, Japan, Brookman Technology, Hamamatsu, Japan, 3 Sanei Hytechs, Hamamatsu, Japan 2 Low-noise CMOS image sensors (CIS) employing column-parallel amplifiers that significantly reduce temporal noise, as well as electron-multiplication CCD (EM-CCD) image sensors are becoming popular for very-low-light-level imaging. These low-noise imagers with high-gain amplification in either the charge or voltage domains sacrifice the intra-scene dynamic range. Scientific applications of solid-state imagers strongly require very low temporal noise and wide intrascene dynamic range as well as very high gray-scale resolution. A column-parallel analog-to-digital converter (ADC) and column-level signal processing in CISs are key techniques to meet these requirements. Single-slope [1,2], successive-approximation [3] and cyclic ADCs [4] are widely used for the column-parallel

👥 作者与机构

Min-Woong Seo1, Sungho Suh1, Tetsuya Iida2, Hiroshi Watanabe3,