← 返回论文列表 📄 下载原文 PDF  ISSCC 2013 · 15.3
ISSCC 2013Session 15 · DATA CONVERTER TECHNIQUESData Converters65nm CMOS

A 71dB-SNDR 50MS/s 4.2mW CMOS SAR ADC by SNR Enhancement Techniques Utilizing Noise

⚡ 本页包含 AI 生成的分析内容,仅供参考

📋 论文概要

该论文提出了一种利用噪声的SAR ADC,通过噪声整形和动态比较器技术,在50MS/s采样率下实现了71dB SNDR,功耗仅4.2mW,解决了中速高精度SAR ADC功耗过高的问题。

💡 主要创新点

核心指标
71dB SNDR @ 50MS/s, 4.2mW
工艺节点
65nm CMOS
重要性
发表年份
ISSCC 2013

🏷 关键词

SAR ADC噪声整形低功耗高精度

📄 原文摘要

utilizes the high switching speed of nanometer CMOS processes. In recent reports, time-interleaving techniques and multi-bit-per-cycle conversion have boosted speed to the GHz sampling range at low power consumption. However, to achieve SNR of >70dB at moderate sampling speed, SARs still need a lot of power, namely tens of mW [1-2]. In [1], a very high SNR of 90dB is achieved by a stage to amplify residue charge, which is one of the reasons for the 105mW power consumption at 12.5MS/s. In [2], 8× oversampling and a static current pre-amplifier for the comparator improve SNR to 88dB, but the ADC still consumes 66mW. In [3], digital calibration achieves an SNDR of 71dB at 3mW, but double conversion limits the sampling speed to 22.5MS/s.

👥 作者与机构

Takashi Morie, Takuji Miki, Kazuo Matsukawa, Yoji Bando,

Takeshi Okumoto, Koji Obata, Shiro Sakiyama, Shiro Dosho Panasonic, Moriguchi, Japan SAR-ADC power efficiency has improved due to its digitally oriented nature that

分类:Data Converters · 年份:ISSCC 2013