A New TX Leakage-Suppression Technique for an RFID Receiver Using a Dead-Zone Amplifier Then, IB, (W/L)13, and VLKG, but is not dependent on Vt.

📋 论文概要

针对RFID接收机中TX泄漏导致灵敏度下降的问题，提出了一种基于死区放大器的新TX泄漏抑制技术。该技术有效减少了来自发射机的连续波泄漏，提高了接收机灵敏度。

💡 主要创新点

• 提出使用死区放大器电路结构来抑制TX泄漏，无需外部隔离器件。
• 通过死区放大器的非线性特性，在泄漏信号较小时提供高增益，泄漏信号较大时自动降低增益，实现泄漏抑制。

🏷 关键词

📄 原文摘要

continuous wave (CW) to provide energy to the tag while the RX receives data from it. Due to the simultaneous operation of the RX and TX, large TX leakage is the main issue in securing RX sensitivity. Although external isolation components such as a circulator or directional coupler are widely used in RFID systems, TX leakage is still a dominant source of sensitivity degradation due to its finite isolation and environmentally dependent antenna reflection ratio, as shown in Fig. 5.6.1(a). In a single-antenna-based RFID system, the TX carrier leakage is typically above 0dBm at the RX input despite off-chip isolation components [1]. As can be seen in Fig. 5.6.1(b), when the close-in phase noise of the TX carrier is -85dBc/Hz, the phase noise level of 0dBm TX leakage in the receive channel

👥 作者与机构

Sang-Sung Lee1, Jaeheon Lee2, In-Young Lee1, Sang-Gug Lee1, Jinho Ko2

KAIST, Daejeon, Korea, PHYCHIPS, Daejeon, Korea 1 2 RFID systems use backscattering communication in which the TX transmits a