A Physically Unclonable Function with BER <10-8 for Robust Chip Authentication Using Oscillator Collapse in 40nm CMOS

📋 论文概要

该论文提出了一种基于振荡器崩溃的物理不可克隆函数（PUF），在40nm CMOS工艺中实现了低于10^-8的误码率（BER），用于鲁棒的芯片认证。通过利用振荡器崩溃现象，该PUF能够生成唯一且稳定的芯片响应，解决了传统PUF在环境变化下可靠性低的问题。

💡 主要创新点

• 提出基于振荡器崩溃的新型PUF结构，利用振荡器在特定条件下的崩溃行为产生唯一响应，提高了PUF的稳定性和可靠性。
• 实现了低于10^-8的极低误码率，显著优于传统PUF，无需纠错码即可满足高可靠性芯片认证需求。
• 在40nm CMOS工艺中验证，展示了低功耗和小面积的优势，适用于移动设备等安全敏感应用。

🏷 关键词

📄 原文摘要

Security is a key concern in today’s mobile devices and a number of hardware implementations of security primitives have been proposed, including true random number generators, differential power attack avoidance, and chip-ID generators [1-4]. Recently, physically unclonable functions (PUFs) were proposed as a secure method for chip authentication in unsecure environments [5-7]. A PUF is a function that maps an input code (“challenge”) to an output code (“response”) in a manner that is unique for every chip. PUFs are increasingly used for IC authentication to offer protection against identity theft, cloning, and counterfeit components [2-4]. Conventional authentication methods using secret keys, digital signatures, and encryption have high computational expense and are vulnerable to tampering

👥 作者与机构

Kaiyuan Yang, Qing Dong, David Blaauw, Dennis Sylvester

University of Michigan, Ann Arbor, MI