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ISSCC 2015Session 16 · EMERGING TECHNOLOGIES ENABLING NEXT-GENERATION SYSTEMSOther28nm CMOS

A NEMS-Array Control IC for Sub-Attogram Gravimetric Sensing Applications in 28nm CMOS Technology

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📋 论文概要

本文提出了一种采用28nm CMOS工艺的NEMS阵列控制集成电路,用于亚阿克级质量传感应用。该芯片解决了NEMS传感器在高频(10MHz-1GHz)和高驱动电压(1V-10V)下的驱动电子挑战,通过NEMS/CMOS共集成实现高灵敏度质量检测。

💡 主要创新点

工艺节点
28nm CMOS
重要性
发表年份
ISSCC 2015

🏷 关键词

NEMS阵列控制IC重力传感28nm CMOS亚阿克质量检测

📄 原文摘要

promoted NEMS sensors as viable and highly sensitive candidates for gravimetric applications such as gas sensing, mass spectrometry and biochemical analysis [1]. The high sensitivity to mass is related to the small dimensions and intrinsic mass of the NEMS themselves, which results in resonant frequencies in the 10MHz-to-1GHz range and drive voltages reaching 1V to 10V. Such a combination of frequencies and voltages is a challenge for the driving electronics. Although several promising approaches using NEMS/CMOS co-integration have been recently published [2], many experiments in the field are currently using discrete electronic boards and specialized lab instruments. To respond to size, power and cost demands, an IC

👥 作者与机构

Nicolas Delorme1, Christophe Le Blanc1, Alessandro Dezzani1,

Mickaël Bely1, Alexandre Ferret1, Simon Laminette1, Jérôme Roudier1, Eric Colinet2 Asygn, Grenoble, France, Apix Analytics, Grenoble, France 1 2 Progress in silicon technology has

分类:Other · 年份:ISSCC 2015