⚡ 本页包含 AI 生成的分析内容，仅供参考
该论文提出了一种微流控-CMOS集成平台，包含3D电容传感器和全集成收发器IC，用于掌上型介电谱测量。通过定量测量材料的复相对介电常数随频率的变化，实现了无标记、非破坏性的实时监测，适用于结构生物学、发酵监控、食品安全和临床诊断等领域。
Quantitative measurement of the complex relative dielectric permittivity (εr) of a material vs. frequency (i.e., dielectric spectroscopy, or DS) is a powerful monitoring technique that extracts key information on molecular characteristics of the material-under-test (MUT) via its interactions with electromagnetic waves in a broad frequency range. Despite its potential as a label-free, nondestructive, real-time and fully electrical monitoring modality for myriad applications, including structural biology, fermentation monitoring for alcoholic beverages, food safety control and clinical diagnostics, DS is still underutilized as an analytic tool in scientific research or clinical settings. This is due to the dearth of an autonomous, small-sized, low-power and portable instrument to conduct MHz-to-GHz DS measurements without requiring a microwave probe station, benchtop vector network analyzer (VNA) equipment, or large (100’s of mL)
Mehran Bakhshiani, Michael A. Suster, Pedram Mohseni
Case Western Reserve University, Cleveland, OH