⚡ 本页包含 AI 生成的分析内容,仅供参考
该论文设计了一个25Gb/s的基于ADC的串行线接收器,采用32nm CMOS SOI工艺,旨在解决高速串行通信中模拟电路对工艺、电压、温度(PVT)敏感的问题。通过数字基带处理替代传统模拟均衡,实现了PVT无关的高性能接收。
Thomas Toifl2, Yong Liu3, Ankur Agrawal1, Peter Buchmann2, Alexander Rylyakov4, Michael Beakes1, Benjamin Parker1, Mounir Meghelli1 IBM T. J. Watson Reseach Center, Yorktown Heights, NY, IBM Zurich Research Laboratory, Rüschlikon, Switzerland, 3 now with Shanghai Jiao Tong University, Shanghai, China, 4 now with Coriant Advanced Technology Group, New York, NY 1 2 As CMOS devices continue to scale down in voltage and area, digital-based highspeed serial I/Os [1] become increasingly competitive with analog-based designs [2,3]. In addition to offering the PVT-independent performance of digital functions and superior power and area scaling to future technology nodes, digital-based I/Os can support advanced line modulation techniques that will become necessary as long-reach electrical channel data rates scale to 56Gb/s and beyond. The key enablers of a digital receiver are power and area efficient analog to digital
Sergey Rylov1, Troy Beukema1, Zeynep Toprak-Deniz1,