⚡ 本页包含 AI 生成的分析内容,仅供参考
本文提出五种系统电源管理技术,用于提高28nm x86-64微处理器的性能和能效。这些技术克服了Vmax可靠性、基础设施限制、老化及热限制等障碍,在成熟SoC上实现了高达15%的性能提升。
Ravinder Rachala1, Sriram Sambamurthy1, Steven Liepe2, Miguel Rodriguez2, Tom Burd3, Adam Clark4, Michael Austin1, Samuel Naffziger2 AMD, Austin, TX, AMD, Fort Collins, CO, 3 AMD, Sunnyvale, CA, 4 AMD, Markham, ON, Canada 1 2 Power-management techniques can be effective at squeezing more performance and energy efficiency out of mature SoCs. Vmax reliability limits, infrastructure limits, guard-bands, aging, and thermal limits all put restrictions on performance. This paper describes five power-management techniques that provide a net performance increase of up to 15%, depending on the application and TDP of the SoC, on “Bristol Ridge”, a 28nm CMOS dual-core x86 APU. Reliability Tracker: In a high-performance microprocessor, the critical limiters to long-term reliability are time-dependent dielectric breakdown (TDDB) and electromigration (EM). TDDB is enormously dependent on voltage, and both
Aaron Grenat1, Sriram Sundaram1, Stephen Kosonocky2,