Fully Integrated Low-Drop-Out Regulator Based on Event-Driven PI Control

📋 论文概要

该论文提出一种基于事件驱动PI控制的全集成低压差稳压器（LDO），通过事件驱动方式缩短控制环路延迟，从而无需片外大输出电容，实现了低功耗和小面积集成。

💡 主要创新点

• 提出事件驱动PI控制算法，仅在负载变化时触发控制动作，大幅降低功耗和环路延迟。
• 实现全集成LDO，无需片外输出电容，适用于SoC多电源域。
• 采用自适应频率调节，在低负载下进一步节省功耗。

🏷 关键词

📄 原文摘要

Modern SoC designs employ a number of power domains, many of which are often implemented by low-drop-out (LDO) regulators. The key overhead of the existing LDO design is the large off-chip output capacitor (Cout) for compensating a large/fast change in load current (ILOAD). Miniaturizing and thus integrating COUT on a chip is highly desirable and theoretically possible by shortening the control loop latency. This can be achieved by employing a higher sampling frequency (FCLK) in a synchronous time-driven digital LDO [1] and a high-speed amplifier in an analog LDO [2]. However, large power consumption and the resulting low current efficiency are often inevitable. In this work, we aim to break this trade-off between passive size and efficiency by introducing an event-driven (ED) control scheme. We design the level-crossing event detector and the ED PI controller for short latency. The power dissipation is kept small since no event occurs in the

👥 作者与机构

Doyun Kim, Mingoo Seok

Columbia University, New York, NY