Physically Unclonable Function for Secure Key Generation with a Key Error Rate of 2E-38 in 45nm Smart-Card Chips

📋 论文概要

该论文提出了一种基于物理不可克隆函数（PUF）的安全密钥生成方案，在45nm智能卡芯片上实现了极低的密钥错误率（2E-38）。通过利用芯片制造过程中的MOSFET失配等固有特性，解决了传统非易失性存储器（NVM）方案中存在的主动数据探测和外部密钥传输等安全问题。

💡 主要创新点

• 实现了极低的密钥错误率（2E-38），显著提升了PUF的可靠性。
• 在45nm智能卡芯片上集成PUF，适用于低功耗安全应用。
• 利用芯片制造过程中的随机失配作为熵源，避免了传统NVM的安全漏洞。

🏷 关键词

📄 原文摘要

keys or chip IDs based on intrinsic properties of each chip itself [1-2]. PUFs are a step forward to improve the security level compared to traditional NVM (nonvolatile memory) solutions (FUSEs, EEPROM/FLASH, etc.) because they resolve security issues, such as active data-probing, transferring the security key from outside, etc. Since the MOSFET mismatch (e.g. size, doping concentration, mobility and oxide thickness) due to process variations cannot be fully controlled, PUFs, which are based on such phenomena, cannot be replicated. Unfortunately, the PUF output is erroneous by nature, as caused by thermal noise, voltage/temperature influence, aging effects, etc. The stability issue must be overcome since standard security applications, such as data encryption and digital

👥 作者与机构

Bohdan Karpinskyy, Yongki Lee, Yunhyeok Choi, Yongsoo Kim,

Mijung Noh, Sanghyun Lee Samsung Electronics, Hwaseong, Korea Physically unclonable function (PUF) circuits are for generating unique secure