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本文提出一种基于4F2交叉点多层金属纳米点结构的永久数字存档系统,利用金属纳米点的存在与否存储数据,实现超过1000年的数据保持能力。通过检测互电容变化读取数据,并采用0/1位平衡编码增强长期可靠性,在0.18μm CMOS原型中验证了加速老化后的功能,28nm CMOS下6层存储堆栈可实现0.4Tb/inch²的容量。
Data is saved by the presence of a metal nano-dot at a x-point of interconnects. This passive storage node works as a permanent memory cell with >1,000-years endurance. No transistor is used in the cell, enabling multi-layer memory stack for high-density. Mutual capacitance change due to the nano-dot presence is sensed for data retrieve. A 0/1-bitbalanced encoding enhances long-time reliability. A 0.18μm CMOS prototype successfully operates after accelerated aging (equivalent to a 1,000-years period). A 6-layer memory stack in 28nm CMOS can realize 0.4Tb/inch2 capacity. Worldwide today, the amount of digital data produced and replicated every year is about to approach 10ZB (=1022Bytes) and is predicted to grow up to 40ZB in 2020. This so-called Digital Universe contains precious digital information heritage such as cultural, scientific, personal, and governmental data to be preserved
Noriyuki Miura, Shijia Liu, Tsuyoshi Watanabe, Shigeki Imai, Makoto Nagata
Kobe University, Kobe, Japan A 4F2 permanent digital archive system is presented