← 返回论文列表 📄 下载原文 PDF  ISSCC 2018 · 19.3
ISSCC 2018Session 19 · SENSORS AND INTERFACESRF & Wireless65nm CMOS

A 0.53pJ∙K2 7000μm2 Resistor-Based Temperature Sensor with an Inaccuracy of ±0.35°C (3σ) in 65nm CMOS

⚡ 本页包含 AI 生成的分析内容,仅供参考

📋 论文概要

本文提出了一种基于电阻的温度传感器,采用65nm CMOS工艺,实现了0.53pJ∙K²的能耗和7000μm²的小面积,并在-40°C至125°C范围内达到±0.35°C(3σ)的高精度,解决了传统BJT传感器在亚1V供电下不兼容以及面积过大的问题。

💡 主要创新点

核心指标
±0.35°C (3σ) inaccuracy, 0.53pJ∙K² energy, 7000μm² area
工艺节点
65nm CMOS
重要性
发表年份
ISSCC 2018

🏷 关键词

电阻式温度传感器片上温度传感器低功耗高精度65nm CMOS

📄 原文摘要

Jieun Jang2, Junhyun Chun2, Kofi A. A. Makinwa3, Youngcheol Chae1 Yonsei University, Seoul, Korea; 2SK hynix, Icheon, Korea Delft University of Technology, Delft, The Netherlands 1 3 In microprocessors and DRAMs, on-chip temperature sensors are essential components, ensuring reliability by monitoring thermal gradients and hot spots. Such sensors must be as small as possible, since multiple sensors are required for dense thermal monitoring. However, conventional BJT-based temperature sensors are not compatible with the sub-1V supply of advanced processes. Subthreshold MOSFETs can operate from lower supplies, but at high temperatures their performance is limited by leakage [1,2]. Thermal diffusivity (TD) sensors achieve sub-1V operation and small area with moderate accuracy, but require milliwatts of power [3]. Recently, resistor-based sensors based on RC WienBridge (WB) filters have realized high resolution and energy efficiency [4,5].

👥 作者与机构

Woojun Choi1, Yong-Tae Lee1, Seonhong Kim2, Sanghoon Lee2,

分类:RF & Wireless · 年份:ISSCC 2018