A PUF Scheme Using Competing Oxide Rupture with Bit Error Rate Approaching Zero

📋 论文概要

该论文提出了一种基于竞争性氧化物击穿的物理不可克隆函数（PUF）方案，通过利用两个晶体管栅氧化层击穿的竞争过程生成稳定且唯一的响应，实现了接近零的比特错误率，从而解决了传统PUF可靠性不足的问题。

💡 主要创新点

• 利用竞争性氧化物击穿机制生成PUF响应，通过控制击穿过程提高随机性和稳定性。
• 实现了接近零的比特错误率，无需额外纠错电路，大幅提升PUF的可靠性和实用性。

📄 原文摘要

Hao-Chun Hu, Fang-Ying Su, Chih-Min Wang, James Po-Hao Huang, Hsin-Ming Chen, Chris Chun-Hung Lu, Evans Ching-Sung Yang, Rick Shih-Jye Shen eMemory, Hsinchu, Taiwan Security is critical to today’s interconnected world, and hardware protection is equally important as security at the network and system levels. Silicon physically unclonable functions (PUFs) are increasingly used as a hardware root of trust and an entropy source for cryptography applications. In those applications, the reliability of PUF output is key to a successful implementation. Both weak and strong PUFs obtain output by amplifying analog signals from physical properties on IC blocks (e.g. propagation delay, ring oscillator, time-controlled oxide breakdown [1] or threshold voltage of SRAM transistors [2,3,4]). These physical measurements are by nature sensitive to environmental conditions, such as temperature, operating voltage, thermal/interface noise of transistors, process

👥 作者与机构

Meng-Yi Wu, Tsao-Hsin Yang, Lun-Chun Chen, Chi-Chang Lin,