A 445F2 Leakage-Based Physically Unclonable Function with Lossless Stabilization Through Remapping for IoT Security

📋 论文概要

该论文提出了一种基于泄漏电流的物理不可克隆函数（PUF），通过重映射技术实现无损稳定，适用于物联网安全。解决了传统PUF在面积效率和稳定性方面的不足，实现了445F2的超小面积。

💡 主要创新点

• 利用泄漏电流作为熵源，实现高面积效率的PUF单元，面积仅445F2。
• 提出无损重映射稳定化技术，在不牺牲比特率的情况下提高PUF的可靠性。

🏷 关键词

📄 原文摘要

With the advent of the IoT era, billions of devices are connected to networks, and assuring sufficient security at low cost is a critical concern. Physically Unclonable Functions (PUFs) have drawn increasing attention as key security building blocks for authentication since each PUF circuit has unique challenge response pairs (CRPs). Such uniqueness is achieved by maximizing the effects of process variation using process-sensitive circuits, i.e. PUF cells. Recently reported PUF cell types include cells based on a two-transistor amplifier [1], NAND gate [2], ring oscillator [3], current mirror [4], back-to-back connected inverters [5], and inverter [6]. Regardless of the variation source, PUFs inevitably include CRPs that respond inconsistently when the process variation of the compared element in the CRP is small compared to noise. For example, if the output of a two-transistor amplifier in [1] is near the switching threshold, the output can be inconsistent,

👥 作者与机构

Jongmin Lee, Donghyeon Lee, Yongmin Lee, Yoonmyung Lee

Sungkyunkwan University, Suwon, Korea