⚡ 本页包含 AI 生成的分析内容，仅供参考
本文提出了一种在28nm FDSOI工艺上实现的高可靠性物理不可克隆函数（PUF），满足AEC-Q100 Grade 1和ISO26262 ASI汽车级标准。通过结合多种投票机制和纠错技术，解决了PUF响应稳定性问题，适用于安全密钥生成。
Physically Unclonable Functions (PUFs) are considered a secure method for security key generation because they generate responses that exist only during operation. A challenge regarding the use of PUFs is to achieve high reliability. Therefore, various schemes such as temporal majority voting [2,3,4], spatial majority voting [1], BCH [1,3], and burn-in [3], are applied to improve the stability of the responses. While a recent paper proposed a method of oxide-break to achieve zero error [5], it is controversial if it is a real PUF since the response value (i.e. the status of the oxide-break) can be observed by reverse engineering. Automotive is an application area where reliability is particularly important, as failures may lead to critical accidents. To satisfy the reliability of AEC-Q100 Grade
Yunhyeok Choi, Bohdan Karpinskyy, Kyoung-Moon Ahn, Yongsoo Kim,
Soonkwan Kwon, Jieun Park, Yongki Lee, Mijung Noh Samsung Electronics, Hwaseong, Korea Protection of information is of paramount importance in today’s digital age