A 0.42THz Coherent TX-RX System Achieving 10dBm EIRP and 27dB NF in 40nm CMOS for Phase-Contrast Imaging

📋 论文概要

本文提出一个0.42THz相干收发系统，采用40nm CMOS工艺，实现了10dBm EIRP和27dB NF，用于相位对比成像，解决了硅基集成THz相位检测的难题。

💡 主要创新点

• 首次在硅基CMOS中实现太赫兹频段的相干收发系统，支持相位检测。
• 采用40nm CMOS工艺，在0.42THz实现10dBm EIRP和27dB NF，适用于高分辨率相位对比成像。

🏷 关键词

📄 原文摘要

The small wavelength and non-ionizing nature of EM waves in the THz spectrum make this frequency band attractive for high-resolution imaging applications. While amplitudebased THz imaging systems have already been demonstrated in Silicon [1], an integrated solution for phase detection in this frequency range has not been reported so far. Detecting the phase change of THz waves passing through the imaged object would enable applications like high-precision thickness measurement and dielectric permittivity characterization. Furthermore, phase-contrast imaging techniques allow scanning of weakly absorbing materials, such as soft tissues and polymers, where amplitude-based scanners are incapable of providing clear pictures [2]. However, the mentioned applications demand high phase-detection accuracy, imposing strict SNR requirements on THz phase imagers for real-time operation. The main SNR limitation of such systems

👥 作者与机构

Dragan Simic, Kaizhe Guo, Patrick Reynaert

KU Leuven - MICAS, Leuven, Belgium