⚡ 本页包含 AI 生成的分析内容,仅供参考
该论文提出了一种结合工艺失配放大器和振荡器崩溃拓扑的物理不可克隆函数(PUF),旨在解决物联网应用中低成本安全认证的需求。通过利用工艺变化产生的不可预测性,该PUF能够生成唯一且稳定的挑战-响应对,同时保持小面积和低功耗。
Physically unclonable functions (PUFs) have been actively investigated as a promising solution for low-cost secure authentication in Internet of Things (IoT) applications. A PUF should generate unique challenge-response pairs (CRPs) which need to be determined solely by process variations (which are unpredictable) with strong immunity to supply and temperature changes. A PUF requires intrinsically stable and reliable operation while keeping area small and power consumption low. Approaches using metastability can provide efficient operation with fast response [1], but they suffer from high sensitivity to noise, supply and temperature changes. To achieve better stability, circuits for amplification of process skew effects have been adopted in PUF cells. The two-transistor amplifier [2], NAND-gate [3] and current-starved inverter [4] have been proposed as static amplifiers for detection of process mismatch, achieving further
Jaehan Park, Jae-Yoon Sim
Pohang University of Science and Technology, Pohang, Korea