An Automatic Self-Checking and Healing Physically Unclonable Function (PUF) with <3×10-8 Bit Error Rate

📋 论文概要

该论文提出了一种具有自动自检查和自修复功能的物理不可克隆函数（PUF）设计，解决了传统PUF在环境变化下可靠性不足的问题，实现了低于3×10^-8的比特错误率，从而减轻了对纠错码的依赖。

💡 主要创新点

• 提出自动自检查机制，能够实时检测PUF输出中的错误比特。
• 引入自修复电路，无需外部干预即可自动纠正检测到的错误，显著提升可靠性。
• 通过电路级优化实现极低比特错误率（<3×10^-8），优于传统PUF设计。

🏷 关键词

📄 原文摘要

*Equally Credited Authors (ECAs) Physically unclonable functions (PUF) have emerged as a promising solution for secure and low-cost key storage and hardware authentication. A key challenge in PUF designs is ensuring the reliability, or reproducibility of PUF keys under environmental variations. While error correction codes (ECC) could help achieve 100% reliable keys [7,9,10], the overhead of the design grows with the worst-case bit-error rate (BER), which will become intractable in mass production (Fig. 36.5.1). Thus, physically more reliable PUF designs are highly desired to alleviate the burden on ECC. State-of-the-art PUF circuit topologies [1] could reduce the native BER to less than 0.5%, but have not shown the potential for another order of magnitude BER reduction. Meanwhile, temporal/spatial majority voting [4,5,8] and burn-in [7] are common physical stabilization methods, but with limited efficacy. Dark (unstable) bit masking, on the other hand, has shown great

👥 作者与机构

Yan He*, Dai Li*, Zhanghao Yu, Kaiyuan Yang

Rice University, Houston, TX