⚡ 本页包含 AI 生成的分析内容,仅供参考
本文提出了一款超过300层、1Tb容量、3b/cell的3D-NAND闪存,实现了194MB/s的写入吞吐量,解决了高密度存储下的性能瓶颈问题。
Kangwook Jo, Yujong Noh, Hyeoncheon Seol, Hyunsoo Lee, Jaehyeon Shin, Seongjin Choi, Youngdon Jung, Sungho Ahn, Yonghun Park, Sujeong Oh, Myungsu Kim, Seonguk Kim, Hyunwook Park, Taeho Lee, Haeun Won, Minsung Kim, Cheulhee Koo, Yeonjoo Choi, Suyoung Choi, Sechun Park, Dongkyu Youn, Junyoun Lim, Wonsun Park, Hwang Hur, Kichang Kwean, Hongsok Choi, Woopyo Jeong, Sungyong Chung, Jungdal Choi, Seonyong Cha SK hynix Semiconductor, Icheon, Korea As data produced by multimedia explodes and demand for data storage increases, the most important topics for the NAND-Flash memory field are continuous performance improvements and cost/bit reduction. To improve performance, features to improve the quality of service (QoS) as well as the read/write performance [1] are required. To reduce the cost/bit, the number of stacked layers needs to increase, while the pitch between stacked layers decreases. It is necessary to manage the increasing WL resistance
Byungryul Kim, Seungpil Lee, Beomseok Hah, Kangwoo Park, Yongsoon Park,