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该论文提出了用于测试高分辨率ADC的带通滤波器和振荡器集成电路,实现了低于-140dBc的总谐波失真(THD)在10Vppd输出下。解决了传统测试硬件THD不足且体积大的问题。
Indian Institute of Technology Madras, Chennai, India 1 2 The growing demand for high-resolution (18 to 20bit) precision ADCs has increased the need for very low THD (< -140dBc) testing hardware that can simultaneously characterize multiple ADCs cost-efficiently in a small form factor. One of the options is to use an active bandpass filter (BPF) to attenuate the harmonics of a medium-accuracy (THD~ -80dBc) sinusoid from a DAC or a bench-top generator. Another option is to generate a -140dBc THD sinusoid using an analog oscillator consisting of a BPF in a positive feedback loop with amplitude stabilization. In either case, the filter’s distortion must be kept below -140dBc at a 10Vppd output swing, which is the typical full scale of ADCs operating with a 5V supply. Among active filters, the second-order Tow-Thomas activeRC topology with opamp-based integrators provides the lowest distortion levels [1].
Subha Sarkar1,2, Rajat Agarwal1, Nagendra Krishnapura2
Texas Instruments, Bangalore, India