3nm Physical Unclonable Function with Multi-Mode Self-Destruction and 3.48×10-5 Bit Error Rate

📋 论文概要

该论文在3nm工艺节点上提出了一种物理不可克隆函数（PUF），通过多模式自毁功能增强安全性，并实现了3.48×10⁻⁵的极低比特错误率（BER）。主要解决了传统PUF中BER难以低于1×10⁻⁴的挑战，通过稳定比特识别和屏蔽不稳定比特单元的方法降低错误率。

💡 主要创新点

• 提出多模式自毁功能，允许PUF在受到攻击或需要时主动销毁密钥，增强安全性。
• 采用受控不平衡的感知过程来检测弱比特单元，实现3.48×10⁻⁵的极低BER，显著优于传统PUF。
• 在3nm先进工艺节点上实现，展示了超低功耗和高集成度的潜力。

🏷 关键词

📄 原文摘要

generate secure encryption keys by exploiting random and unpredictable variations in the manufacturing process. However, achieving an acceptably low Bit Error Rate (BER) below 1×10-4 remains a big challenge. Stable bit identification and masking of unstable bitcells [1,2] enable a significant reduction in BER by eliminating bitcells that exhibit varying data outputs under different testing conditions. This is accomplished through the introduction of a controlled imbalance during the sensing (read) process, allowing the sense amplifier to detect weak bitcells that are likely to be susceptible to noise due to low read signal. In general, more signal (differential voltage or current) during sensing will result in fewer bit errors and enable the amplification of process variations and mismatches [3] to reduce the BER.

👥 作者与机构

Eric Hunt-Schroeder1, Parker Lin-Butler2, Amit Degada1, Tian Xia2

Marvell, Burlington, VT University of Vermont, Burlington, VT 1 2 Silicon Physical Unclonable Functions (PUFs)