⚡ 本页包含 AI 生成的分析内容,仅供参考
本文提出了一种可综合、设计无关的时序故障注入监测器,覆盖2MHz至1.26GHz的宽时钟频率范围,用于检测由时钟信号或电压篡改等低成本手段引起的故障注入攻击,保障芯片安全。
Fault Injection Attacks (FIAs) are powerful attacks that induce and exploit faults in chips to create severe security consequences like faulty results, OS security bypass, and information leakage [1-3]. This paper focuses on low-cost FIAs that induce erroneous outputs by tampering with the clock signals and/or supply voltages via software and hardware exploits and/or physical interference (EM coupling, temperature, etc.). FIAs that directly flip bits through high-energy lasers, particles, or other advanced and costly means are out of our scope, but solutions on compact and standard-cell compatible detectors can be readily combined to complement our defense (like in [4]). We categorize FIA-induced clock glitches into 12 basic types (Fig. 16.5.1), where T1-T2 and T5-T12 aim at inducing error via timing violation, while T3-T4 induce errors by skipping the clock cycles of a partial computation block. These 12 types of glitch patterns form the basis
Yan He, Kaiyuan Yang
Rice University, Houston, TX