A 99.5mW/port DC-to-40GHz Integrated Channel Analyzer for High-Density Signal Integrity Measurement in 28nm CMOS

📋 论文概要

本文提出了一种集成通道分析仪，用于高速高密度信号完整性测量，覆盖DC至40GHz频率范围，功耗仅为99.5mW/端口。该设计解决了传统矢量网络分析仪（VNA）在功耗、尺寸和成本方面的不足，适用于以太网交换机和高性能计算机中的通道缺陷检测。

💡 主要创新点

• 提出了一种低功耗、高集成度的通道分析仪架构，支持多端口并行测量，显著降低了每端口的功耗和面积。
• 实现了DC至40GHz的超宽带频率覆盖，同时保持高测量精度，适用于高速数字链路的信号完整性分析。
• 采用28nm CMOS工艺，将传统分立式VNA功能集成到单芯片中，大幅降低了系统成本和复杂度。

🏷 关键词

📄 原文摘要

Beijing, China 1 2 *Equally Credited Authors (ECAs) The growing demand for higher network bandwidth has led to a significant rise in channel density within Ethernet switches and high-performance computers. As data rates continue to climb, electrical links, such as printed circuit board (PCB) traces and coaxial cables, suffer from greater defects including reflection, crosstalk, and insertion loss. Therefore, low-power and highly efficient signal integrity (SI) measurements are crucial for detecting defects in communication equipment. Traditionally, vector network analyzers (VNAs) and sampling oscilloscopes with time-domain reflectometer modules are employed for SI measurement. However, these instruments are power-hungry, expensive, and inefficient

👥 作者与机构

Guangdong Wu*1, Yuanliang Li*1, Bingyi Ye*1,2, Fangzhu Li1, Xin Liu1, Haowei Niu1,

Ruixu Wang1, Dunshan Yu1, Weixin Gai1,3 Peking University, Beijing, China East China Normal University, Shanghai, China 3 Beijing Advanced Innovation Center for Integrated Circuits,