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ISSCC 2026Session 25 · HARDWARE SECURITYHardware Security65nm CMOS

A 65nm 0.066pJ/b Floating-Latch-Based True Random Number Generator Resilient to Power-Noise Injection Attacks

⚡ 本页包含 AI 生成的分析内容,仅供参考

📋 论文概要

本论文提出了一种基于浮空锁存器的真随机数发生器(FL-TRNG),通过利用浮空储层电容作为电源实现了0.066pJ/b的高能效,同时固有地抵抗电源噪声注入攻击。该架构还采用电流饥饿反相器进行失配补偿,增强了对工艺、电压和温度变化的容忍度。

💡 主要创新点

核心指标
0.066pJ/b
工艺节点
65nm CMOS
重要性
发表年份
ISSCC 2026

🏷 关键词

真随机数发生器浮空锁存器电源噪声攻击抵抗

📄 原文摘要

Abstract In Paper 25.10 a floating-latch-based true random number generator (FL-TRNG) is presented that achieves an energy efficiency of 0.066pJ/b by leveraging a floating reservoir capacitor as its power supply. This architecture inherently offers strong resilience against power- supply noise injection attacks. Furthermore, current-starved inverters are employed within the latch to perform mismatch compensation and enhance PVT tolerance. True random number generators (TRNGs) play a crucial role in ensuring security across various Internet of Things (IoT) applications, including device authentication, secure boot, encrypted sensor data transmission, and dynamic key generation [1,9-10]. These applications demand not only robust cryptographic guarantees but also strict adherence to resource constraints, imposing simultaneous requirements for high energy efficiency, moderate data rates, and resilience against environmental disturbances. While ring oscillator

👥 作者与机构

Kai Cheng1, Yunbo Huang1, Zunsong Yang1, Li Wang1, Hongyu Ren1, Xiaoyu Shan1, Pui-In Mak2, Yong Chen3, Bo Li1

Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China, 2University of Macau, Macau, China, 3Tsinghua University, Beijing, China

分类:Hardware Security · 年份:ISSCC 2026