A Sub-Threshold All-NMOS Reconfigurable PUF with Secure Configuration Selection for Stable 6b/Cell

📋 论文概要

本文提出了一种亚阈值全NMOS可重构物理不可克隆函数（PUF），通过安全配置选择实现每单元6个稳定比特，解决了传统PUF比特错误率高和长期老化问题。该设计在0-70°C和0.6-0.8V范围内达到“零”比特错误率（<6.5e-8），面积仅253F²/有效比特，能耗低至16.8fJ/bit。

💡 主要创新点

• 提出安全配置选择方法，在不暴露秘密PUF数据的情况下实现每单元6个稳定比特，显著提升比特密度和可靠性。
• 采用全NMOS位单元结构，从根本上缓解负偏置温度不稳定性（NBTI）老化效应，并通过45小时加速应力测试验证。
• 工作在亚阈值区域，实现极低能耗（16.8fJ/bit）和紧凑面积（253F²/有效比特），适合资源受限的物联网安全应用。

🏷 关键词

📄 原文摘要

*Equally Credited Authors (ECAs) Abstract In this work, a reconfigurable PUF featuring secure configuration selection is presented. Without exposing secret PUF data, it achieves 6 stable bits per cell (b/cell) and “zero” bit error (<6.5E$8 BER) across 0 to 70°C and 0.6 to 0.8V. The area per effective bit is only 253F2. Operating in the sub-threshold region, the PUF achieves low energy consumption of 16.8fJ/b. The all-NMOS bitcell structure mitigates long-term NBTI aging, which is verified through a 45-hour accelerated stress test. Physically unclonable functions (PUFs) exploit inherent process variations to generate device-specific responses, serving as security primitives for cryptographic key generation

👥 作者与机构

Shufan Xu*, Kunyang Liu*, Lando Chan, Hironori Tagawa, Hirofumi Shinohara, Kiichi Niitsu

Kyoto University, Kyoto, Japan